Strain and interdiffusion in semiconductor heterostructures
نویسندگان
چکیده
منابع مشابه
Strain measurement in semiconductor heterostructures by scanning transmission electron microscopy.
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ژورنال
عنوان ژورنال: Physical Review B
سال: 1994
ISSN: 0163-1829,1095-3795
DOI: 10.1103/physrevb.50.7495